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・ X-ray fluorescence holography
・ X-ray generator
・ X-ray image intensifier
・ X-ray interferometer
・ X-Ray Kid Studios
・ X-ray laser
・ X-ray lithography
・ X-ray magnetic circular dichroism
・ X-ray marker
・ X-Ray Mega Airport
・ X-ray microscope
・ X-ray microtomography
・ X-ray nanoprobe
・ X-ray notation
・ X-Ray of a Lie
X-ray optics
・ X-ray photoelectron spectroscopy
・ X-ray pulsar
・ X-ray pulsar-based navigation
・ X-ray Raman scattering
・ X-ray reflectivity
・ X-ray scattering techniques
・ X-ray source
・ X-Ray Specs
・ X-Ray Specs (comic strip)
・ X-Ray Specs (novelty)
・ X-Ray Spectrometry (journal)
・ X-ray spectroscopy
・ X-Ray Spex
・ X-ray standing waves


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X-ray optics : ウィキペディア英語版
X-ray optics
X-ray optics is the branch of optics that manipulates X-rays instead of visible light. While lenses for visible light are made of transparent materials that can have a refractive index substantially larger than 1, for X-rays the index of refraction is slightly smaller than unity. The principal methods to manipulate X-rays are therefore by reflection, diffraction and interference. Examples of applications include X-ray microscopes and X-ray telescopes. Refraction is the basis for the compound refractive lens, many small X-ray lenses in series that compensate by their number for the X-rays' minute index of refraction. The imaginary part of the refractive index, corresponding to absorption, can also be used to manipulate X-rays: one example is the pin-hole camera, which also works for visible light.
==Reflection==

The basic idea is to reflect a beam of X-rays from a surface and to measure the intensity of X-rays reflected in the specular direction (reflected angle equal to incident angle). It has been shown that a reflection off a parabolic mirror followed by a reflection off a hyperbolic mirror can lead to the focusing of X-rays.〔 Since the incoming X-rays must strike the tilted surface of the mirror, the collecting area is small. It can, however, be increased by nesting arrangements of mirrors inside each other.
The ratio of reflected intensity to incident intensity is the X-ray reflectivity for the surface. If the interface is not perfectly sharp and smooth, the reflected intensity will deviate from that predicted by the law of Fresnel reflectivity. The deviations can then be analyzed to obtain the density profile of the interface normal to the surface. For films with multiple layers, X-ray reflectivity may show oscillations with wavelength, analogous to the Fabry-Pérot effect. These oscillations can be used to infer layer thicknesses and other properties.

抄文引用元・出典: フリー百科事典『 ウィキペディア(Wikipedia)
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